Invention Grant
- Patent Title: Loss profile analysis
- Patent Title (中): 损失概况分析
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Application No.: US13696003Application Date: 2011-05-03
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Publication No.: US09132408B2Publication Date: 2015-09-15
- Inventor: Pinchas Einziger , Eran Ben-Shmuel , Alexander Bilchinsky , Amit Rappel
- Applicant: Pinchas Einziger , Amit Rappel
- Applicant Address: BM Hamilton
- Assignee: GOJI LIMITED
- Current Assignee: GOJI LIMITED
- Current Assignee Address: BM Hamilton
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP
- International Application: PCT/IB2011/001489 WO 20110503
- International Announcement: WO2011/138688 WO 20111110
- Main IPC: G01R27/00
- IPC: G01R27/00 ; B01J19/12 ; H05B6/64

Abstract:
Apparatuses and methods are disclosed for applying radio frequency (RF) energy to an object in an energy application zone. At least one processor may be configured to cause RF energy to be applied at a plurality of electromagnetic field patterns to the object in the energy application zone. The processor may be further configured to determine an amount of power dissipated in the energy application zone, for each of the plurality of field patterns. The processor may also be configured to determine a spatial distribution of energy absorption characteristics across at least a portion of the energy application zone based on the amounts of power dissipated when the plurality of field patterns are applied to the energy application zone.
Public/Granted literature
- US20130240757A1 LOSS PROFILE ANALYSIS Public/Granted day:2013-09-19
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