Invention Grant
- Patent Title: Tilt check apparatus and method thereof
- Patent Title (中): 倾斜检查装置及其方法
-
Application No.: US13896648Application Date: 2013-05-17
-
Publication No.: US09134118B2Publication Date: 2015-09-15
- Inventor: Jin-a Jeon
- Applicant: Samsung Electronics Co., Ltd
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2012-0102987 20120917
- Main IPC: G01B11/26
- IPC: G01B11/26 ; G03B43/00 ; G03B17/12

Abstract:
A tilt check apparatus and a tilt check method are provided. The tilt check apparatus checks a lens module including a sensor and a lens and includes: a light-emitting part which diffuses and outputs light to check a tilt of the lens module; a reflector which reflects the diffused light; an interface which, if the reflected light is sensed by the sensor of the lens module, receives the sensed result from the sensor; and a detector which detects depth information by using the sensed result received through the interface and detects a tilt state between the lens and the sensor based on the depth information. Therefore, efficiency of a tilt check process is improved.
Public/Granted literature
- US20140022538A1 TILT CHECK APPARATUS AND METHOD THEREOF Public/Granted day:2014-01-23
Information query