A method is provided for sensing data in a memory device. The memory device includes a block of memory cells coupled to a plurality of bit lines. The method includes precharging the plurality of bit lines to a first level VPRE. The method includes enabling current flow through selected memory cells on the plurality of bit lines to a reference line or to reference lines coupled to a reference voltage. The method includes preventing a voltage change as a result of the current flow on the bit lines from causing a bit line voltage to pass outside a range between the first level and a second level VKEEP, where the second level is lower than the first level and higher than the reference voltage. The method includes sensing data in the selected memory cells.