Invention Grant
- Patent Title: Short-checking methods
- Patent Title (中): 短检方法
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Application No.: US13922378Application Date: 2013-06-20
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Publication No.: US09136017B2Publication Date: 2015-09-15
- Inventor: Toru Tanzawa
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/02 ; G11C16/04 ; G11C29/12

Abstract:
In an embodiment, a short-checking method includes charging a data line to an initial voltage while activating a memory cell coupled to the data line, allowing the data line to float while continuing to activate the memory cell, sensing a resulting voltage on the data line after a certain time, and determining whether a short exists in response to a level of the resulting voltage.
Public/Granted literature
- US20140375348A1 SHORT-CHECKING METHODS Public/Granted day:2014-12-25
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