Invention Grant
- Patent Title: Optical layer monitoring apparatus and method thereof
- Patent Title (中): 光层监测装置及其方法
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Application No.: US13838309Application Date: 2013-03-15
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Publication No.: US09136941B2Publication Date: 2015-09-15
- Inventor: Han-Hyub Lee , Seung-Il Myong , Eui-Suk Jung , Sang-Soo Lee
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon-si
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon-si
- Agency: Nelson Mullins Riley & Scarborough LLP
- Agent Anthony A. Laurentano, Esq.
- Priority: KR10-2012-0046575 20120502
- Main IPC: H04B10/08
- IPC: H04B10/08 ; H04B10/071

Abstract:
An optical layer monitoring apparatus and method thereof are provided. According to an embodiment of the present invention, an optical layer monitoring apparatus including an optical time domain reflectometer (OTDR) function so as to monitor an optical path of a passive optical network (PON), and a method for improving accuracy of measured monitoring results using the optical layer monitoring apparatus are provided. Therefore, it is possible to enable a user to continuously detect distortion or attenuation along the optical path, and to quickly recover from the distortion or attenuation along the optical path when distortion or attenuation is detected.
Public/Granted literature
- US20130294768A1 OPTICAL LAYER MONITORING APPARATUS AND METHOD THEREOF Public/Granted day:2013-11-07
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