Invention Grant
- Patent Title: Mass measurement device
- Patent Title (中): 质量测量装置
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Application No.: US14345723Application Date: 2012-09-18
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Publication No.: US09140598B2Publication Date: 2015-09-22
- Inventor: Makoto Nakatani , Akihito Suzuki , Satoshi Konishi
- Applicant: ISHIDA CO., LTD.
- Applicant Address: JP Kyoto
- Assignee: ISHIDA CO., LTD.
- Current Assignee: ISHIDA CO., LTD.
- Current Assignee Address: JP Kyoto
- Agency: Global IP Counselors, LLP
- Priority: JP2011-204357 20110920; JP2012-039107 20120224; JP2012-048945 20120306; JP2012-061899 20120319; JP2012-084461 20120403
- International Application: PCT/JP2012/073856 WO 20120918
- International Announcement: WO2013/042667 WO 20130328
- Main IPC: G01G19/00
- IPC: G01G19/00 ; B25J13/08 ; B25J19/02 ; G01G3/14 ; G01G9/00

Abstract:
A mass measurement device measures the mass of an article, even when the article is being moved. A mass measurement device includes a robot hand, a robot arm, a force sensor, an acceleration sensor, and a control unit. The robot hand holds an article (Q). The robot arm moves the robot hand. The force sensor is provided between the robot hand and the robot arm and measures force acting on the article (Q) during movement. The acceleration sensor measures acceleration acting on the article (Q) during the movement. The control unit runs and controls the robot hand and the robot arm, and calculates the mass of the article (Q) on the basis of the force and acceleration acting on the article (Q) during the movement.
Public/Granted literature
- US20140230581A1 MASS MEASUREMENT DEVICE Public/Granted day:2014-08-21
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