Invention Grant
US09142292B2 Method for reading data from nonvolatile storage element, and nonvolatile storage device
有权
从非易失性存储元件读取数据的方法和非易失性存储器件
- Patent Title: Method for reading data from nonvolatile storage element, and nonvolatile storage device
- Patent Title (中): 从非易失性存储元件读取数据的方法和非易失性存储器件
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Application No.: US13982280Application Date: 2012-01-31
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Publication No.: US09142292B2Publication Date: 2015-09-22
- Inventor: Yoshihiko Kanzawa , Takeshi Takagi
- Applicant: Yoshihiko Kanzawa , Takeshi Takagi
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2011-021135 20110202
- International Application: PCT/JP2012/000608 WO 20120131
- International Announcement: WO2012/105232 WO 20120809
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; H01L27/24 ; H01L45/00

Abstract:
Provided is a method for reading data from a variable resistance nonvolatile storage element, where the operation for reading data is less susceptible to a fluctuation phenomenon of resistance values in reading the data. The method includes: detecting a current value Iread that flows through the nonvolatile storage element that can be in a low resistance state RL and a high resistance state RH, with application of a fixed voltage; and determining that (i) the nonvolatile storage element is in a high resistance state when the current value Iread detected in the detecting is smaller than a current reference level Iref, and (ii) the nonvolatile storage element is in a low resistance state when the current value Iread detected in the detecting is larger than the reference level Iref, the current reference level Iref being defined by (IRL+IRH)/2
Public/Granted literature
- US20130308371A1 METHOD FOR READING DATA FROM NONVOLATILE STORAGE ELEMENT, AND NONVOLATILE STORAGE DEVICE Public/Granted day:2013-11-21
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