发明授权
US09153404B2 Charged particle beam scanning using deformed high gradient insulator
有权
使用变形高梯度绝缘子的带电粒子束扫描
- 专利标题: Charged particle beam scanning using deformed high gradient insulator
- 专利标题(中): 使用变形高梯度绝缘子的带电粒子束扫描
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申请号: US13705084申请日: 2012-12-04
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公开(公告)号: US09153404B2公开(公告)日: 2015-10-06
- 发明人: Yu-Jiuan Chen
- 申请人: Lawrence Livermore National Security, LLC
- 申请人地址: US CA Livermore
- 专利权人: Lawrence Livermore National Security, LLC
- 当前专利权人: Lawrence Livermore National Security, LLC
- 当前专利权人地址: US CA Livermore
- 代理机构: Perkins Coie LLP
- 主分类号: H01J3/26
- IPC分类号: H01J3/26 ; A61N5/10 ; G21K1/087
摘要:
Devices and methods are provided to allow rapid deflection of a charged particle beam. The disclosed devices can, for example, be used as part of a hadron therapy system to allow scanning of a target area within a patient's body. The disclosed charged particle beam deflectors include a dielectric wall accelerator (DWA) with a hollow center and a dielectric wall that is substantially parallel to a z-axis that runs through the hollow center. The dielectric wall includes one or more deformed high gradient insulators (HGIs) that are configured to produce an electric field with an component in a direction perpendicular to the z-axis. A control component is also provided to establish the electric field component in the direction perpendicular to the z-axis and to control deflection of a charged particle beam in the direction perpendicular to the z-axis as the charged particle beam travels through the hollow center of the DWA.
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