Invention Grant
- Patent Title: Short coherence interferometry for measuring distances
- Patent Title (中): 用于测量距离的短相干干涉测量
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Application No.: US13000276Application Date: 2009-06-12
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Publication No.: US09155462B2Publication Date: 2015-10-13
- Inventor: Martin Hacker , Ralf Ebersbach , Thomas Pabst
- Applicant: Martin Hacker , Ralf Ebersbach , Thomas Pabst
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Meditec AG
- Current Assignee: Carl Zeiss Meditec AG
- Current Assignee Address: DE Jena
- Agency: Patterson Thuente Pedersen, P.A.
- Priority: DE102008029479 20080620
- International Application: PCT/EP2009/004264 WO 20090612
- International Announcement: WO2009/153005 WO 20091223
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01J5/60 ; G01J3/45 ; G01B11/02 ; A61B3/10 ; A61B3/15

Abstract:
A short coherence interferometer for measuring several axially spaced-apart regions of a sample, especially of an eye, which has a measuring optical path, through which the measuring radiation falls on the sample, a tunable interferometer for the axial, relative retardation of parts of the radiation, wherein the axial relative retardation is assigned to the axial spacing of the regions and a detector for producing an interference signal from interfering measurement radiation, scattered or reflected back from the sample as sample radiation. The tunable interferometer divides the sample radiation into two parts, which are axially relatively retarded and superimposed so as to interfere. During the superimposition, the tunable interferometer forms individual radiations, which represent quadrature components of the sample radiation, and the detector detects the individual radiations.
Public/Granted literature
- US20110109913A1 SHORT COHERENCE INTERFEROMETRY FOR MEASURING FOR MEASURING SPACINGS Public/Granted day:2011-05-12
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