Invention Grant
- Patent Title: Method for adjusting parameters of impedance control
- Patent Title (中): 调整阻抗控制参数的方法
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Application No.: US14085794Application Date: 2013-11-21
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Publication No.: US09156164B2Publication Date: 2015-10-13
- Inventor: Shingo Ando , Ryoichi Nagai , Yasuyuki Inoue
- Applicant: KABUSHIKI KAISHA YASKAWA DENKI
- Applicant Address: JP Kitakyushu-Shi
- Assignee: KABUSHIKI KAISHA YASKAWA DENKI
- Current Assignee: KABUSHIKI KAISHA YASKAWA DENKI
- Current Assignee Address: JP Kitakyushu-Shi
- Agency: Mori & Ward, LLP
- Priority: JP2009-241324 20091020
- Main IPC: B25J9/16
- IPC: B25J9/16 ; B25J13/08

Abstract:
In a method for adjusting parameters of impedance control, an overshoot amount allowable value is set as an allowable maximum value of an overshoot amount of a time response of a force feedback from a force sensor provided for an end effector of a robot manipulator, and a setting time allowable value is set as an allowable maximum value of a setting time of the time response of the force feedback. A viscosity parameter with which the setting time is shortest is calculated while fixing the inertia parameter. An overshoot amount adjustment value and a setting time adjustment value which are obtained from a result of the calculating of the viscosity parameter are compared with the overshoot amount allowable value and the setting time allowable value, respectively, to determine whether a repeating process is finished or continued.
Public/Granted literature
- US20140081460A1 METHOD FOR ADJUSTING PARAMETERS OF IMPEDANCE CONTROL Public/Granted day:2014-03-20
Information query
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