发明授权
- 专利标题: Faceted semiconductor nanowire
- 专利标题(中): 分面半导体纳米线
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申请号: US13828867申请日: 2013-03-14
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公开(公告)号: US09159834B2公开(公告)日: 2015-10-13
- 发明人: Kangguo Cheng , Juntao Li , Zhen Zhang , Yu Zhu
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Scully, Scott, Murphy & Presser, P.C.
- 代理商 Louis J. Percello, Esq.
- 主分类号: H01L29/78
- IPC分类号: H01L29/78 ; H01L29/66 ; B82Y10/00 ; B82Y40/00 ; H01L29/775 ; H01L29/04 ; H01L29/06 ; H01L29/786
摘要:
Selective epitaxy of a semiconductor material is performed on a semiconductor fin to form a semiconductor nanowire. Surfaces of the semiconductor nanowire include facets that are non-horizontal and non-vertical. A gate electrode can be formed over the semiconductor nanowire such that the faceted surfaces can be employed as channel surfaces. The epitaxially deposited portions of the faceted semiconductor nanowire can apply stress to the channels. Further, an additional semiconductor material may be added to form an outer shell of the faceted semiconductor nanowire prior to forming a gate electrode thereupon. The faceted surfaces of the semiconductor nanowire provide well-defined charge carrier transport properties, which can be advantageously employed to provide a semiconductor device with well-controlled device characteristics.
公开/授权文献
- US20140264279A1 FACETED SEMICONDUCTOR NANOWIRE 公开/授权日:2014-09-18
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