发明授权
- 专利标题: Method and system for characterizing and visualizing electromagnetic tracking errors
- 专利标题(中): 表征和可视化电磁跟踪误差的方法和系统
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申请号: US13582062申请日: 2011-02-21
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公开(公告)号: US09165114B2公开(公告)日: 2015-10-20
- 发明人: Ameet Kumar Jain , Mohammad Babak Matinfar , Raymond Chan , Vijay Parthasarthy , Douglas A. Stanton
- 申请人: Ameet Kumar Jain , Mohammad Babak Matinfar , Raymond Chan , Vijay Parthasarthy , Douglas A. Stanton
- 申请人地址: NL Eindhoven
- 专利权人: Koninklijke Philips N.V.
- 当前专利权人: Koninklijke Philips N.V.
- 当前专利权人地址: NL Eindhoven
- 国际申请: PCT/IB2011/050706 WO 20110221
- 国际公布: WO2011/110966 WO 20110915
- 主分类号: A61B5/055
- IPC分类号: A61B5/055 ; G06F19/00 ; A61B19/00 ; A61B17/00
摘要:
A calibration/surgical tool includes an electromagnetic sensor array of two or more electromagnetic sensors in a known geometrical configuration. Electromagnetic tracking errors are characterized by a mapping of pre-operative absolute and relative errors based on a movement of a calibrated calibration/surgical tool through a pre-operative electromagnetic field. Using statistical mapping, a desired absolute error field is measured either in the clinic as the part of daily quality control checks, or before the patient comes in or in vivo. A resulting error field may be displayed to the physician to provide clear visual feedback about measurement confidence or reliability of localization estimates of the absolute errors in electromagnetic tracking.
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