Invention Grant
- Patent Title: Semiconductor memory device including sensing verification unit
- Patent Title (中): 半导体存储器件包括检测验证单元
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Application No.: US13795567Application Date: 2013-03-12
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Publication No.: US09165673B2Publication Date: 2015-10-20
- Inventor: Je-Min Yu , Ho-Young Song , Sung-Min Seo , Sang-Joon Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2012-0025663 20120313
- Main IPC: G11C17/00
- IPC: G11C17/00 ; G11C17/16 ; G11C17/18

Abstract:
A semiconductor memory device includes a memory cell array configured to store data including a verification code; a sensing unit configured to sense the stored data including the verification code; and a verification unit configured to determine whether the sensing unit is able to sense the stored data based on a sensing condition, wherein the verification unit is configured to determine whether the sensing unit is able to sense the stored data based on the sensing condition and a value of the verification code sensed by the sensing unit.
Public/Granted literature
- US20130242635A1 SEMICONDUCTOR MEMORY DEVICE INCLUDING SENSING VERIFICATION UNIT Public/Granted day:2013-09-19
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