Invention Grant
US09165687B2 Methods and apparatus for testing and repairing digital memory circuits
有权
用于测试和修复数字存储器电路的方法和装置
- Patent Title: Methods and apparatus for testing and repairing digital memory circuits
- Patent Title (中): 用于测试和修复数字存储器电路的方法和装置
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Application No.: US14160542Application Date: 2014-01-21
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Publication No.: US09165687B2Publication Date: 2015-10-20
- Inventor: Sundar Iyer , Shadab Nazar , Sanjeev Joshi
- Applicant: Cisco Technology, Inc.
- Applicant Address: US CA San Jose
- Assignee: Cisco Technology, Inc.
- Current Assignee: Cisco Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Edell, Shapiro & Finnan, LLC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/08 ; G11C29/56 ; G11C29/04
Abstract:
An ActiveTest solution for memory is disclosed which can search for memory errors during the operation of a product containing digital memory. The ActiveTest system tests memory banks that are not being accessed by normal memory users in order to continually test the memory system in the background. When there is a conflict between the ActiveTest system and a memory user, the memory user is generally given priority.
Public/Granted literature
- US20140344635A1 Methods And Apparatus For Testing And Repairing Digital Memory Circuits Public/Granted day:2014-11-20
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