发明授权
- 专利标题: Method of die singulation using laser ablation and induction of internal defects with a laser
- 专利标题(中): 使用激光烧蚀和激光诱导内部缺陷的芯片切割方法
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申请号: US14320419申请日: 2014-06-30
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公开(公告)号: US09165832B1公开(公告)日: 2015-10-20
- 发明人: James S. Papanu , Wei-Sheng Lei , Jungrae Park , Alexander Lerner , Brad Eaton , Ajay Kumar
- 申请人: James S. Papanu , Wei-Sheng Lei , Jungrae Park , Alexander Lerner , Brad Eaton , Ajay Kumar
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely Sokoloff Taylor Zafman LLP
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/78 ; H01L21/304 ; H01L21/268 ; H01L21/683
摘要:
A method and system of hybrid laser dicing are described. In one embodiment, a method includes focusing a laser beam inside a substrate in regions between integrated circuits, inducing defects inside the substrate in the regions. The method involves patterning a surface of the substrate with a laser scribing process in the regions after inducing the defects in the substrate. The method further involves singulating the integrated circuits at the regions with the induced defects. In another embodiment, a system includes a first laser module configured to focus a laser beam inside a substrate in regions between integrated circuits, inducing defects inside the substrate in the regions. A second laser module is configured to pattern a surface of the substrate with a laser scribing process in the regions after inducing the defects. A tape extender is configured to stretch tape over which the substrate is mounted, singulating the integrated circuits.
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