Invention Grant
US09165853B2 Closed loop temperature controlled circuit to improve device stability
有权
闭环温度控制电路，提高器件的稳定性
- Patent Title: Closed loop temperature controlled circuit to improve device stability
- Patent Title (中): 闭环温度控制电路，提高器件的稳定性
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Application No.: US14586231Application Date: 2014-12-30
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Publication No.: US09165853B2Publication Date: 2015-10-20
- Inventor: Fuchao Wang , Olivier Leneel , Ravi Shankar
- Applicant: STMICROELECTRONICS ASIA PACIFIC PTE LTD , STMICROELECTRONICS, INC.
- Applicant Address: SG Singapore US TX Coppell
- Assignee: STMicroelectronics Asia Pacific Pte. Ltd.,STMicroelectronics, Inc.
- Current Assignee: STMicroelectronics Asia Pacific Pte. Ltd.,STMicroelectronics, Inc.
- Current Assignee Address: SG Singapore US TX Coppell
- Agency: Seed IP Law Group PLLC
- Main IPC: H05B1/02
- IPC: H05B1/02 ; H01L23/34 ; H05B3/12 ; H05B3/34 ; H05B3/02
Abstract:
An integrated circuit is provided having an active circuit. A heating element is adjacent to the active circuit and configured to heat the active circuit. A temperature sensor is also adjacent to the active circuit and configured to measure a temperature of the active circuit. A temperature controller is coupled to the active circuit and configured to receive a temperature signal from the temperature sensor. The temperature controller operates the heating element to heat the active circuit to maintain the temperature of the active circuit in a selected temperature range.
Public/Granted literature
- US20150108105A1 CLOSED LOOP TEMPERATURE CONTROLLED CIRCUIT TO IMPROVE DEVICE STABILITY Public/Granted day:2015-04-23
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