Invention Grant
US09170154B2 Data validation and classification in optical analysis systems 有权
光学分析系统中的数据验证和分类

Data validation and classification in optical analysis systems
Abstract:
A method of classifying information in an optical analysis system includes obtaining calibration data defining a plurality of data points, each data point representing values for two or more detectors when sampling a material used to construct a multivariate optical element. Based on the calibration data, one or more validation models can be developed to indicate one or more ranges of expected results. Validation data comprising the models can be used to compare data points representing values for two or more detectors when performing a measurement of a material to determine if the data points fall within an expected range. Classification data can be generated based on the comparison and, in some embodiments, one or more indicators, such as a confidence level in a measurement, can be provided.
Public/Granted literature
Information query
Patent Agency Ranking
0/0