Invention Grant
US09171227B2 Apparatus and method extracting feature information of a source image
有权
设备和方法提取源图像的特征信息
- Patent Title: Apparatus and method extracting feature information of a source image
- Patent Title (中): 设备和方法提取源图像的特征信息
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Application No.: US13922449Application Date: 2013-06-20
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Publication No.: US09171227B2Publication Date: 2015-10-27
- Inventor: Yong Min Tai , Young Su Moon , Jung Uk Cho , Joon Hyuk Cha , Hyun Sang Park , Shi Hwa Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2012-0066061 20120620
- Main IPC: G06K9/46
- IPC: G06K9/46 ; G06K9/00

Abstract:
Provided is an apparatus and method for extracting feature information of an image using a scale-invariant feature transform (SIFT) algorithm. The apparatus may include a first interface configured to generate one or more tile images from a first source image stored in a particular memory, such as a high-capacity short-term memory, and a feature information extractor configured to receive the generated one or more tile images and to respectively extract feature information from each of the one or more input tile images, where the first interface may be configured to generate the one or more tile images by selectively dividing the first source image into the one or more tile images based on a horizontal resolution of the first source image.
Public/Granted literature
- US20130343655A1 APPARATUS AND METHOD EXTRACTING FEATURE INFORMATION OF A SOURCE IMAGE Public/Granted day:2013-12-26
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