Temperature-adjusted spectrometer

Invention Grant

US09177877B2 Temperature-adjusted spectrometer 有权

Title translation: 温度调节光谱仪

Patent Title: Temperature-adjusted spectrometer
Patent Title (中): 温度调节光谱仪
Application No.: US14259906

Application Date: 2014-04-23
Publication No.: US09177877B2

Publication Date: 2015-11-03
Inventor: Markus E. Beck , Ming L. Yu
Applicant: First Solar, Inc.
Applicant Address: US OH Perrysburg
Assignee: First Solar, Inc.
Current Assignee: First Solar, Inc.
Current Assignee Address: US OH Perrysburg
Agency: Dickstein Shapiro LLP
Main IPC: H01L21/66
IPC: H01L21/66 ; G01J3/02 ; G01J3/28 ; G01J3/44 ; G01N21/65 ; H01L31/032 ; H01L31/18 ; G01J5/08

Abstract:

A temperature-adjusted spectrometer can include a light source and a temperature sensor.

Abstract(Chinese):

温度调节光谱仪可以包括光源和温度传感器。

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IPC分类:

H	电学
H01	基本电气元件
H01L	半导体器件；其他类目中不包括的电固体器件（使用半导体器件的测量入G01；一般电阻器入H01C；磁体、电感器、变压器入H01F；一般电容器入H01G；电解型器件入H01G9/00；电池组、蓄电池入H01M；波导管、谐振器或波导型线路入H01P；线路连接器、汇流器入H01R；受激发射器件入H01S；机电谐振器入H03H；扬声器、送话器、留声机拾音器或类似的声机电传感器入H04R；一般电光源入H05B；印刷电路、混合电路、电设备的外壳或结构零部件、电气元件的组件的制造入H05K；在具有特殊应用的电路中使用的半导体器件见应用相关的小类）
H01L21/00	专门适用于制造或处理半导体或固体器件或其部件的方法或设备
H01L21/66	.在制造或处理过程中的测试或测量