Invention Grant
- Patent Title: Method and device for processing location information of fault point
- Patent Title (中): 故障点位置信息处理方法及装置
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Application No.: US14081007Application Date: 2013-11-15
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Publication No.: US09178756B2Publication Date: 2015-11-03
- Inventor: Changsheng Sun , Yu Zhang , Linkun Chen
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Huawei Technologies Co., Ltd.
- Current Assignee: Huawei Technologies Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Conley Rose, P.C.
- Agent Grant Rodolph
- Priority: CN201210315040 20120830
- Main IPC: H04L12/24
- IPC: H04L12/24 ; H04L12/723 ; H04L12/703 ; H04L12/437

Abstract:
Embodiments of the present invention provide a method and a device for processing location information of a fault point. The method includes: obtaining, by an ingress node of an LDP LSP, first location information of a fault point on a link traversed by the LDP LSP, where the first location information of the fault point includes an identifier of an upstream node of the fault point and an identifier of an interface that is connected to the fault point and located on the upstream node of the fault point; and providing the first location information of the fault point to a user so that the user determines a location of the fault point corresponding to an LDP LSP fault. Therefore, the location of the fault point corresponding to the LDP LSP fault can be determined, and efficiency of troubleshooting specific to the LDP LSP fault can be improved.
Public/Granted literature
- US20140071834A1 Method and Device for Processing Location Information of Fault Point Public/Granted day:2014-03-13
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