Invention Grant
US09182767B2 Devices and methods for calibrating and operating a snapback clamp circuit
有权
用于校准和操作快速恢复钳位电路的装置和方法
- Patent Title: Devices and methods for calibrating and operating a snapback clamp circuit
- Patent Title (中): 用于校准和操作快速恢复钳位电路的装置和方法
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Application No.: US13794268Application Date: 2013-03-11
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Publication No.: US09182767B2Publication Date: 2015-11-10
- Inventor: Ankit Srivastava , Matthew David Sienko , Eugene Robert Worley
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM INCORPORATED
- Current Assignee: QUALCOMM INCORPORATED
- Current Assignee Address: US CA San Diego
- Agency: Patterson & Sheridan, LLP
- Main IPC: H02H9/00
- IPC: H02H9/00 ; G05F1/10 ; H01L27/02 ; H01L27/06 ; H02H9/04 ; H02H3/00

Abstract:
A device includes a snapback clamp circuit configured to clamp a supply voltage in response to the supply voltage exceeding a trigger voltage level. In at least one embodiment, the snapback clamp circuit includes a clamp transistor and a programmable resistance portion that is responsive to a control signal to calibrate the trigger voltage level. Alternatively or in addition, the snapback clamp circuit may include a programmable bias device configured to calibrate the trigger voltage level by biasing a gate terminal of the clamp transistor. In another particular embodiment, a method of calibrating a snapback clamp circuit is disclosed. In another particular embodiment, a method of operating an integrated circuit is disclosed.
Public/Granted literature
- US20140254051A1 DEVICES AND METHODS FOR CALIBRATING AND OPERATING A SNAPBACK CLAMP CIRCUIT Public/Granted day:2014-09-11
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