发明授权
US09182767B2 Devices and methods for calibrating and operating a snapback clamp circuit
有权
用于校准和操作快速恢复钳位电路的装置和方法
- 专利标题: Devices and methods for calibrating and operating a snapback clamp circuit
- 专利标题(中): 用于校准和操作快速恢复钳位电路的装置和方法
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申请号: US13794268申请日: 2013-03-11
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公开(公告)号: US09182767B2公开(公告)日: 2015-11-10
- 发明人: Ankit Srivastava , Matthew David Sienko , Eugene Robert Worley
- 申请人: QUALCOMM Incorporated
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM INCORPORATED
- 当前专利权人: QUALCOMM INCORPORATED
- 当前专利权人地址: US CA San Diego
- 代理机构: Patterson & Sheridan, LLP
- 主分类号: H02H9/00
- IPC分类号: H02H9/00 ; G05F1/10 ; H01L27/02 ; H01L27/06 ; H02H9/04 ; H02H3/00
摘要:
A device includes a snapback clamp circuit configured to clamp a supply voltage in response to the supply voltage exceeding a trigger voltage level. In at least one embodiment, the snapback clamp circuit includes a clamp transistor and a programmable resistance portion that is responsive to a control signal to calibrate the trigger voltage level. Alternatively or in addition, the snapback clamp circuit may include a programmable bias device configured to calibrate the trigger voltage level by biasing a gate terminal of the clamp transistor. In another particular embodiment, a method of calibrating a snapback clamp circuit is disclosed. In another particular embodiment, a method of operating an integrated circuit is disclosed.
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