Invention Grant
- Patent Title: Error detection and correction of one-time programmable elements
- Patent Title (中): 一次性可编程元件的错误检测和校正
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Application No.: US13752419Application Date: 2013-01-29
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Publication No.: US09183082B2Publication Date: 2015-11-10
- Inventor: Jung Pill Kim , Taehyun Kim , Sungryul Kim
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Toler Law Group, PC
- Main IPC: G06F7/02
- IPC: G06F7/02 ; G06F11/10 ; G11C17/02 ; G11C17/14 ; G11C17/18 ; G11C29/02 ; G11C29/44

Abstract:
A circuit includes a first one-time programmable (OTP) element and a second OTP element. The circuit also includes error detection circuitry coupled to receive a first representation of data from the first OTP element. The circuit further includes output circuitry responsive to an output of the error detection circuitry to output an OTP read result based on the first representation of the data or based on a second representation of the data from the second OTP element.
Public/Granted literature
- US20140215294A1 ERROR DETECTION AND CORRECTION OF ONE-TIME PROGRAMMABLE ELEMENTS Public/Granted day:2014-07-31
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