Invention Grant
- Patent Title: Inspection apparatus
- Patent Title (中): 检验仪器
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Application No.: US11790883Application Date: 2007-04-27
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Publication No.: US09183450B2Publication Date: 2015-11-10
- Inventor: Yuichi Abe , Mitsuji Ikeda
- Applicant: Yuichi Abe , Mitsuji Ikeda
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-122880 20060427
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/00 ; G06K9/03 ; G06T7/00

Abstract:
An inspection apparatus and method are provided, wherein even when an image that cannot be processed by a current image processing algorithm is input to an image processing unit while a working line is in operation, the inspection can be continued by newly generating an image processing algorithm optimized in keeping with a particular image. The apparatus includes an erroneous recognition detector, a teacher data generator and a switching unit for switching the current image processing algorithm to a new image processing algorithm generated based on an updated teacher data group. As a result, the inspection can be continued without extremely decreasing the accuracy even when an unexpected image is input to the working line.
Public/Granted literature
- US20070258640A1 Inspection apparatus Public/Granted day:2007-11-08
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