Invention Grant
- Patent Title: Apparatuses, integrated circuits, and methods for measuring leakage current
- Patent Title (中): 仪器,集成电路和测量漏电流的方法
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Application No.: US14514218Application Date: 2014-10-14
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Publication No.: US09183948B2Publication Date: 2015-11-10
- Inventor: Shigekazu Yamada
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/02 ; G11C8/08 ; G11C29/12 ; G11C29/50

Abstract:
Methods, apparatuses, and integrated circuits for measuring leakage current are disclosed. In one such example method, a word line is charged to a first voltage, and a measurement node is charged to a second voltage, the second voltage being less than the first voltage. The measurement node is proportionally coupled to the word line. A voltage on the measurement node is compared with a reference voltage. A signal is generated, the signal being indicative of the comparison. Whether a leakage current of the word line is acceptable or not can be determined based on the signal.
Public/Granted literature
- US20150029802A1 APPARATUSES, INTEGRATED CIRCUITS, AND METHODS FOR MEASURING LEAKAGE CURRENT Public/Granted day:2015-01-29
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