发明授权
- 专利标题: Interconnect pillars with directed compliance geometry
- 专利标题(中): 互连柱与定向符合几何
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申请号: US13187694申请日: 2011-07-21
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公开(公告)号: US09184144B2公开(公告)日: 2015-11-10
- 发明人: Zhongping Bao , James D. Burrell , Shiqun Gu
- 申请人: Zhongping Bao , James D. Burrell , Shiqun Gu
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM Incorporated
- 当前专利权人: QUALCOMM Incorporated
- 当前专利权人地址: US CA San Diego
- 代理商 Michelle S. Gallardo
- 主分类号: B32B37/14
- IPC分类号: B32B37/14 ; H01L21/28 ; H01L23/00
摘要:
Pillars having a directed compliance geometry are arranged to couple a semiconductor die to a substrate. The direction of maximum compliance of each pillar may be aligned with the direction of maximum stress caused by unequal thermal expansion and contraction of the semiconductor die and substrate. Pillars may be designed and constructed with various shapes having particular compliance characteristics and particular directions of maximum compliance. The shape and orientation of the pillars may be selected as a function of their location on a die to accommodate the direction and magnitude of stress at their location. A method includes fabricating pillars with particular shapes by patterning to increase surface of materials upon which the pillar is plated or deposited.
公开/授权文献
- US20130020711A1 Interconnect Pillars with Directed Compliance Geometry 公开/授权日:2013-01-24
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