Invention Grant
- Patent Title: Module and capacitance detecting method
- Patent Title (中): 模块和电容检测方法
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Application No.: US14509896Application Date: 2014-10-08
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Publication No.: US09188616B2Publication Date: 2015-11-17
- Inventor: Shoji Nagumo , Masashi Nakazato , Yujie Dai , Xiaoxing Zhang , Yingjie Lu
- Applicant: MURATA MANUFACTURING CO., LTD.
- Applicant Address: JP Nagaokakyo-Shi, Kyoto-Fu
- Assignee: MURATA MANUFACTURING CO., LTD.
- Current Assignee: MURATA MANUFACTURING CO., LTD.
- Current Assignee Address: JP Nagaokakyo-Shi, Kyoto-Fu
- Agency: Arent Fox LLP
- Main IPC: G01R27/26
- IPC: G01R27/26 ; H03K17/955

Abstract:
A capacitance detecting circuit includes a constant current source supplying a constant current to a voltage detection point, a time measuring unit measuring time of charge until the voltage of the voltage detection point reaches a prescribed voltage, a storage unit and an operation unit. The storage unit stores first data obtained in advance concerning the time of charge of a capacitance element having a known capacitance value, and second data obtained in advance concerning the time of charge of a capacitance component. The operation unit generates third data representing the time of charge of an object of detection from a difference between the first measurement value of the time measuring unit when the capacitance component is connected to the voltage detection point and the second data, and based on the ratio between the third data and the first data and the known capacitance value, calculates the capacitance value of the object of detection.
Public/Granted literature
- US20150084652A1 Module and Capacitance Detecting Method Public/Granted day:2015-03-26
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