Invention Grant
- Patent Title: Method and apparatus for three-dimensional measurement and image processing device
- Patent Title (中): 三维测量和图像处理装置的方法和装置
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Application No.: US14579252Application Date: 2014-12-22
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Publication No.: US09197880B2Publication Date: 2015-11-24
- Inventor: Tomonori Masuda
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2012-146468 20120629
- Main IPC: H04N13/02
- IPC: H04N13/02 ; G01B11/245 ; G06T7/00 ; G01C11/06

Abstract:
Three-dimensional measurement apparatus comprises first and second imaging units with baseline length, feature point detector for detecting feature points in image, corresponding point detector for detecting corresponding points corresponding to the feature points, rotation matrix calculator, translation matrix calculator, distance calculator, and data calculator. Based on the feature points and the corresponding points, the rotation matrix calculator calculates a rotation matrix representing direction and amount of rotation of a second image capture position relative to a first image capture position and the translation matrix calculator calculates a translation matrix representing a translation direction of the second image capture position relative to the first image capture position. Based on the rotation matrix, the translation matrix, and the baseline length, the distance calculator calculates a translation distance to the second image capture position relative to the first image capture position. The data calculator calculates three-dimensional data based on the translation distance.
Public/Granted literature
- US20150109420A1 METHOD AND APPARATUS FOR THREE-DIMENSIONAL MEASUREMENT AND IMAGE PROCESSING DEVICE Public/Granted day:2015-04-23
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