A method and apparatus to measure and analyze electromagnetic emissions from implanted electronics to accomplish at least one of: detect and identify an active implant comprising electronics implanted in a biological host, diagnose the health of individual electronics as well as their health as an ensemble, and predict probable degradation of individual electronics, degradation of the electronic ensemble, and of the active implant in an automated fashion. The methods comprise filtering techniques to extract the information about the active implant's electronics by filtering out relevant biological effects induced by the active implant's biological situation. Said detection, identification, diagnosis, and prognosis are based on the measurement of intentional and unintentional electromagnetic emissions that emanate from the implant electronics of the active implant in a given biological situation.