Invention Grant
- Patent Title: Apparatus and method for controlling temperature of matching material
- Patent Title (中): 用于控制匹配材料温度的装置和方法
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Application No.: US14561336Application Date: 2014-12-05
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Publication No.: US09207191B2Publication Date: 2015-12-08
- Inventor: Jang Yeol Kim , Jong Moon Lee , Hyuk Je Kim , Seong Ho Son , Soon Ik Jeon
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: William Park & Associates Ltd.
- Priority: KR10-2013-0157459 20131217
- Main IPC: G01N22/00
- IPC: G01N22/00 ; A61B6/00

Abstract:
An apparatus and method of controlling a temperature of a matching material used in an apparatus for generating a tomographic image is disclosed. The method includes measuring a temperature of a matching material in which an object is immersed in an apparatus for measuring a shape of an object, setting a set temperature at which an amplitude and a phase of an electromagnetic wave that passes through the matching material are maintained, based on the measured temperature of the matching material, and controlling the temperature of the matching material to be higher than the set temperature.
Public/Granted literature
- US20150168315A1 APPARATUS AND METHOD FOR CONTROLLING TEMPERATURE OF MATCHING MATERIAL Public/Granted day:2015-06-18
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