Invention Grant
- Patent Title: Calculating quality indicators of computer applications based on application events
- Patent Title (中): 根据应用事件计算计算机应用的质量指标
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Application No.: US14610944Application Date: 2015-01-30
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Publication No.: US09208000B2Publication Date: 2015-12-08
- Inventor: Ioannis Vlachogiannis , Vasileios Karampinas
- Applicant: Splunk Inc.
- Applicant Address: US CA San Francisco
- Assignee: Splunk Inc.
- Current Assignee: Splunk Inc.
- Current Assignee Address: US CA San Francisco
- Agency: Wong & Rees LLP
- Agent Kirk D. Wong
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F9/54 ; G06F11/07 ; G06F11/34 ; G06F11/30 ; G06F9/44

Abstract:
A quality score for a computer application release is determined using a first number of unique users who have launched the computer application release on user devices and a second number of unique users who have encountered at least once an abnormal termination with the computer application release on user devices. Additionally or optionally, an application quality score can be computed for a computer application based on quality scores of computer application releases that represent different versions of the computer application. Additionally or optionally, a weighted application quality score can be computed for a computer application by further taking into consideration the average application quality score and popularity of a plurality of computer applications.
Public/Granted literature
- US20150261585A1 CALCULATING QUALITY INDICATORS OF COMPUTER APPLICATIONS BASED ON APPLICATION EVENTS Public/Granted day:2015-09-17
Information query