Disclosed is a sample analyzer including a transporting part configured to transport a sample rack holding one or more samples, a measuring part configured to perform a measurement on the sample of the transported sample rack and a controller. The controller is programmed to perform an analysis of a predetermined item that requires at least first and second measurement results derived respectively from first and second samples obtained from the same subject and preprocessed in different ways, and if a measurement of the predetermined item is requested and a set of first and second samples obtained from the same subject and preprocessed in different ways are transported to the measuring part, the controller controls the measuring part to perform measurements on both of the first and second samples to derive the first and second measurement results and processes them to generate an analysis result of the predetermined item.