Invention Grant
- Patent Title: High frequency phase shifter array testing
- Patent Title (中): 高频移相器阵列测试
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Application No.: US13746029Application Date: 2013-01-21
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Publication No.: US09214726B2Publication Date: 2015-12-15
- Inventor: Adem G. Aydin , Hanyi Ding
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hoffman Warnick LLC
- Agent Steven J Meyers
- Main IPC: H01Q3/26
- IPC: H01Q3/26

Abstract:
Aspects of the invention provide for an architecture and method for testing high frequency phase shifter arrays. In one embodiment, an architecture for testing a phase shifter array, includes: a plurality of power dividers, each power divider configured to receive an output from a phase shifter within the phase shifter array and split the output into a first signal and a second signal; a plurality of power clippers, each power clipper configured to receive the second signal and modify the second signal by limiting an amplitude of the second signal; a first power combiner configured to receive the first signal from each of the plurality of power dividers to generate a first output; and a second power combiner configured to receive the modified second signal from each of the plurality of power clippers to generate a second output.
Public/Granted literature
- US20140203967A1 HIGH FREQUENCY PHASE SHIFTER ARRAY TESTING Public/Granted day:2014-07-24
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