Invention Grant
- Patent Title: Apparatus and method for evaluating statistical interference concerning multi-source noise environment of electromagnetic zone
- Patent Title (中): 用于评估电磁区域多源噪声环境的统计干扰的装置和方法
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Application No.: US13911501Application Date: 2013-06-06
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Publication No.: US09214971B2Publication Date: 2015-12-15
- Inventor: Su Na Choi , Seung Keun Park
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Nelson Mullins Riley & Scarborough LLP
- Agent Anthony A. Laurentano, Esq.; Michael Malone, Esq.
- Priority: KR10-2012-0134263 20121126
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04B1/10

Abstract:
An apparatus and method for evaluating statistical interference concerning a multi-source noise environment of an electromagnetic (EM) zone are disclosed. The apparatus for evaluating statistical interference may include a receiver to receive an EM wave in a preset frequency band, a spectrum analyzer to analyze the received EM wave and to measure interference in the preset frequency band, a frequency selector to select an interest frequency in the frequency band based on a level of the measured interference, an amplitude probability distribution (APD) measurement unit to measure an APD of an interference signal with respect to the interest frequency, and a comparator to compare the measured APD to a preset limit and to draw a probability of the limit or higher of interference occurring.
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