发明授权
US09215425B1 Camera-aided focusing in optical metrology 有权
相机辅助重点在光学计量学

  • 专利标题: Camera-aided focusing in optical metrology
  • 专利标题(中): 相机辅助重点在光学计量学
  • 申请号: US13758912
    申请日: 2013-02-04
  • 公开(公告)号: US09215425B1
    公开(公告)日: 2015-12-15
  • 发明人: Colin FarrellJan van Burken
  • 申请人: Colin FarrellJan van Burken
  • 申请人地址: US CA Santa Barbara
  • 专利权人: BRUKER NANO INC.
  • 当前专利权人: BRUKER NANO INC.
  • 当前专利权人地址: US CA Santa Barbara
  • 代理商 Antonio R. Durando
  • 主分类号: H04N7/18
  • IPC分类号: H04N7/18
Camera-aided focusing in optical metrology
摘要:
A side camera is combined with a conventional optical metrology system to image the object during the focusing scan performed in normal focusing procedures. The camera is positioned in fixed spatial relation to the objective and with its focal plane in substantial alignment with the optical axis of the objective so as to image the object during the scan. The camera is used to monitor the illumination spot formed on the object by the beam projected through the system's objective. The in-focus position is found by moving the object such that the illumination spot coincides with the objective's focus seen through the camera.
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