Invention Grant
- Patent Title: Object recognition apparatus using spectrometer and method thereof
- Patent Title (中): 使用光谱仪的物体识别装置及其方法
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Application No.: US14306866Application Date: 2014-06-17
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Publication No.: US09217670B2Publication Date: 2015-12-22
- Inventor: Nac Woo Kim , Byung Tak Lee , Mun Seob Lee , Sim Kwon Yoon , Young Sun Kim
- Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2013-0159296 20131219
- Main IPC: G01J3/40
- IPC: G01J3/40 ; G01J3/28 ; G06T7/00

Abstract:
Provided are an apparatus and method for recognizing an object on the basis of property information on an object obtained using a multi-wavelength spectrometer. An apparatus for recognizing an object using a multi-wavelength spectrometer includes an image processing unit configured to extract an region of interest from an input three-dimensional image and output shape information on the region of interest, a light irradiation unit configured to irradiate light of a plurality of wavelengths to an arbitrary position of an object corresponding to the detected region of interest, a light receiving unit configured to measure a spectrophotometric value for each light of the plurality of wavelengths, and a light processing unit configured to generate a differential spectrophotometric map using a differential value between spectrophotometric values of different wavelengths measured at the same light irradiation position, and recognize the object using the differential spectrophotometric map and the shape information.
Public/Granted literature
- US20150177066A1 OBJECT RECOGNITION APPARATUS USING SPECTROMETER AND METHOD THEREOF Public/Granted day:2015-06-25
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