发明授权
US09218934B2 Charged particle beam system and method of operating a charged particle beam system
有权
带电粒子束系统和操作带电粒子束系统的方法
- 专利标题: Charged particle beam system and method of operating a charged particle beam system
- 专利标题(中): 带电粒子束系统和操作带电粒子束系统的方法
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申请号: US14314262申请日: 2014-06-25
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公开(公告)号: US09218934B2公开(公告)日: 2015-12-22
- 发明人: John A. Notte, IV , Weijie Huang , FHM-Faridur Rahman , Shawn McVey
- 申请人: Carl Zeiss Microscopy, LLC
- 申请人地址: US NY Thornwood
- 专利权人: Carl Zeiss Microscopy, LLC
- 当前专利权人: Carl Zeiss Microscopy, LLC
- 当前专利权人地址: US NY Thornwood
- 代理机构: Fish & Richardson P.C.
- 主分类号: H01J27/26
- IPC分类号: H01J27/26 ; H01J37/08 ; H01J37/18 ; G21K5/04
摘要:
The disclosure relates to a method of operating a gas field ion beam system in which the gas field ion beam system comprises an external housing, an internal housing, arranged within the external housing, an electrically conductive tip arranged within the internal housing, a gas supply for supplying one or more gases to the internal housing, the gas supply having a tube terminating within the internal housing, and an extractor electrode having a hole to permit ions generated in the neighborhood of the tip to pass through the hole into the external housing. The method comprises the step of regularly heating the external housing, the internal housing, the electrically conductive tip, the tube and the extractor electrode to a temperature of above 100° C.
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