Invention Grant
US09223668B2 Method and apparatus to trigger and trace on-chip system fabric transactions within the primary scalable fabric
有权
在主要可扩展结构内触发和跟踪片上系统架构事务的方法和装置
- Patent Title: Method and apparatus to trigger and trace on-chip system fabric transactions within the primary scalable fabric
- Patent Title (中): 在主要可扩展结构内触发和跟踪片上系统架构事务的方法和装置
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Application No.: US13800185Application Date: 2013-03-13
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Publication No.: US09223668B2Publication Date: 2015-12-29
- Inventor: Ki Yoon , Robert De Gruijl , Chai Ziv , Michael Klinglesmith
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: INTEL CORPORATION
- Current Assignee: INTEL CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Carrie A. Boone, P.C.
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/26 ; G06F11/273 ; G06F11/36
Abstract:
A fabric trace hook is disclosed to enable debugging operations of agents operating in a peer-to-peer integrated on-chip system fabric. The fabric trace hook, embedded within the IOSF, includes programmable triggering and capturing logic, timestamp capability, and a security feature to disallow tracing of proprietary transactions. The fabric trace hook may operate in a lossy or lossless mode.
Public/Granted literature
Information query
