Invention Grant
US09232478B2 Frequency scan method for determining the system center frequency for LTE TDD
有权
用于确定LTE TDD的系统中心频率的频率扫描方法
- Patent Title: Frequency scan method for determining the system center frequency for LTE TDD
- Patent Title (中): 用于确定LTE TDD的系统中心频率的频率扫描方法
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Application No.: US13781394Application Date: 2013-02-28
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Publication No.: US09232478B2Publication Date: 2016-01-05
- Inventor: Huilin Xu , Raghu Narayan Challa , Hisham A. Mahmoud
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Norton Rose Fulbright US LLP
- Main IPC: H04L1/00
- IPC: H04L1/00 ; H04W52/18 ; H04W52/14 ; H04W48/16 ; H04B17/10

Abstract:
A method, an apparatus, and a computer program product for wireless communication are provided in which a set of time intervals is obtained from a received radio frequency signal. A power profile is determined for a frequency spectrum segment in each time interval. A first list is used to identify frequency spectrum segments that exhibit a power or energy profile over a range of frequencies associated with a downlink channel bandwidth, and a second list is used to identify frequency spectrum segments that have a total or average energy greater than a threshold energy relative to a noise floor. An absolute radio frequency channel number (ARFCN) of a wireless communication system is determined based on the time intervals identified in the first and second lists.
Public/Granted literature
- US20130229955A1 FREQUENCY SCAN METHOD FOR DETERMINING THE SYSTEM CENTER FREQUENCY FOR LTE TDD Public/Granted day:2013-09-05
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