Invention Grant
- Patent Title: Apparatus and method for measuring dielectric constant
- Patent Title (中): 用于测量介电常数的装置和方法
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Application No.: US13913558Application Date: 2013-06-10
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Publication No.: US09234925B2Publication Date: 2016-01-12
- Inventor: Seong-Ook Park , Byeong Yong Park , Myung Hun Jeong
- Applicant: Korea Advanced Institute of Science and Technology
- Applicant Address: KR Daejeon
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Daejeon
- Agency: Hammer & Associates, P.C.
- Main IPC: G01R27/04
- IPC: G01R27/04 ; G01R27/26

Abstract:
Provided are an apparatus and method for measuring a dielectric constant. The apparatus includes a cavity resonator including a cavity therein, an insertion hole penetrating through the cavity vertically and in which a sample is inserted, and grooves symmetrically formed with respect to the cavity in the insertion hole, a network analyzer configured to generate an electromagnetic signal supplied to the cavity resonator, receive an electromagnetic signal passed through the cavity resonator, and calculate a scattering parameter, a transmission means configured to supply the generated electromagnetic signal to the cavity resonator, a reception means configured to supply the electromagnetic signal passed through the cavity resonator to the network analyzer, and a calculation processor configured to receive the scattering parameter from the network analyzer and calculate a dielectric constant of the sample.
Public/Granted literature
- US20140361791A1 APPARATUS AND METHOD FOR MEASURING DIELECTRIC CONSTANT Public/Granted day:2014-12-11
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