Invention Grant
- Patent Title: Transition fault testing of source synchronous interface
- Patent Title (中): 源同步接口的过渡故障测试
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Application No.: US13624372Application Date: 2012-09-21
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Publication No.: US09234942B2Publication Date: 2016-01-12
- Inventor: Anuja Banerjee , Samy R. Makar , Vijay M. Bettada
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Erik A. Heter
- Main IPC: G01R31/3185
- IPC: G01R31/3185

Abstract:
A method and apparatus for conducting a transition test of a source synchronous interface is disclosed. A system includes a source synchronous transmitter and source synchronous receiver. The source synchronous transmitter includes a first scannable flop having an output coupled to a data input of a second scannable flop in the source synchronous receiver. During a transition test, the source synchronous transmitter is configured to transmit data from the first scannable flop to the second scannable flop, along with a clock signal at an operational clock speed. The first scannable flop is coupled to feedback circuitry configured to cause transitions of the transmitted data. The second scannable flop may capture the transmitted data. The captured data may be subsequently used to determine if the desired transitions were detected by the second scannable flop.
Public/Granted literature
- US20140088912A1 Transition Fault Testing of Source Synchronous Interface Public/Granted day:2014-03-27
Information query
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