发明授权
- 专利标题: Lithographic apparatus and device manufacturing method
- 专利标题(中): 平版印刷设备和器件制造方法
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申请号: US13579539申请日: 2011-02-18
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公开(公告)号: US09235140B2公开(公告)日: 2016-01-12
- 发明人: Erwin John Van Zwet , Pieter Willem Herman De Jager , Johannes Onvlee , Erik Christiaan Fritz
- 申请人: Erwin John Van Zwet , Pieter Willem Herman De Jager , Johannes Onvlee , Erik Christiaan Fritz
- 申请人地址: NL Veldhoven
- 专利权人: ASML NETHERLANDS B.V.
- 当前专利权人: ASML NETHERLANDS B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 国际申请: PCT/EP2011/052408 WO 20110218
- 国际公布: WO2011/104180 WO 20110901
- 主分类号: G03B27/54
- IPC分类号: G03B27/54 ; G03F7/20
摘要:
A lithographic apparatus having an optical column capable of projecting a beam on a target portion on a substrate held by the substrate support. The optical column may have a self-emissive contrast device to emit the beam. The optical column may include a projection system to project the beam onto the target portion. The target portion has a height in a scanning direction of the substrate and a tangential width mainly perpendicular to the scanning direction, wherein a scanning speed of the substrate in the scanning direction divided by the height substantially corresponds with a rotating speed of the optical column or a part thereof divided by the tangential width of the target portion.
公开/授权文献
- US20120307223A1 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD 公开/授权日:2012-12-06
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