Invention Grant
- Patent Title: Device and method for fault management of smart device
- Patent Title (中): 智能设备故障管理设备及方法
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Application No.: US14028486Application Date: 2013-09-16
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Publication No.: US09235463B2Publication Date: 2016-01-12
- Inventor: Yong-Hyuk Moon , Jeong-Nyeo Kim , Bo-Heung Chung , Jin-Hee Han , Dae-Won Kim , Hwa-Shin Moon
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Priority: KR10-2012-0117988 20121023
- Main IPC: G06F11/07
- IPC: G06F11/07 ; H04L12/24 ; G06F11/34

Abstract:
There is provided a method of fault management of a smart device including comparing a value of a fault detection indicator (hereinafter referred to as ‘FDI’) in a normal state, which detects faults generated in the smart device, with respect to at least one performance indicator, with an FDI value observed in real time and detecting the faults by calculating a relative variation level of the observed values, and creating a diagnosis object (hereinafter referred to as ‘DO’) including a cause and a countermeasure of the detected fault and analyzing the fault.
Public/Granted literature
- US20140115400A1 DEVICE AND METHOD FOR FAULT MANAGEMENT OF SMART DEVICE Public/Granted day:2014-04-24
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