Invention Grant
- Patent Title: Real-time exposure assessment
- Patent Title (中): 实时曝光评估
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Application No.: US13801232Application Date: 2013-03-13
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Publication No.: US09237531B2Publication Date: 2016-01-12
- Inventor: Lin Lu , Jagadish Nadakuduti , Paul Guckian
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Fountainhead Law Group P.C.
- Main IPC: H04B7/00
- IPC: H04B7/00 ; H04W52/36

Abstract:
Efficient techniques for determining compliance of a wireless device with radio-frequency (RF) exposure standards and regulations. In an aspect, two-dimensional surface scans of a device are determined and stored in a memory during a certification phase. Each scan corresponds to a basis surface scan wherein only one transmitter and one antenna of the device are active. During real-time operation, the basis surface scans corresponding to the real-time active transmitters and antennas of the device are retrieved. The retrieved scans are processed according to the real-time operating parameters to determine an estimated RF exposure metric, e.g., a peak specific absorption rate (SAR). The transmit power levels of the device may be adjusted in real time to ensure compliance of the estimated RF exposure metric with applicable standards and regulations.
Public/Granted literature
- US20140274190A1 REAL-TIME EXPOSURE ASSESSMENT Public/Granted day:2014-09-18
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