Invention Grant
US09240304B2 Specimen holder tip part, specimen holder having said specimen holder tip part, gonio stage, and electron microscope having said gonio stage
有权
试件夹头部，具有所述试样保持器顶端部分的试样夹持器，gonio台和具有所述隆起台的电子显微镜
- Patent Title: Specimen holder tip part, specimen holder having said specimen holder tip part, gonio stage, and electron microscope having said gonio stage
- Patent Title (中): 试件夹头部，具有所述试样保持器顶端部分的试样夹持器，gonio台和具有所述隆起台的电子显微镜
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Application No.: US14414682Application Date: 2013-07-12
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Publication No.: US09240304B2Publication Date: 2016-01-19
- Inventor: Hiroya Miyazaki
- Applicant: Mel-Build Corporation
- Applicant Address: JP Fukuoka
- Assignee: Mel-Build Corporation
- Current Assignee: Mel-Build Corporation
- Current Assignee Address: JP Fukuoka
- Agency: ALG Intellectual Property, LLC
- Priority: JP2012-158550 20120717; JP2012-214258 20120927
- International Application: PCT/JP2013/004315 WO 20130712
- International Announcement: WO2014/013709 WO 20140123
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/20 ; H01J37/26
Abstract:
In at least one embodiment, a specimen holder tip part comprises a specimen setting seat, a specimen mesh for mounting a specimen, a specimen holding part for holding the specimen mesh and a clamping part that clamps the specimen holding part.
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