发明授权
- 专利标题: Reputation analysis system and reputation analysis method
- 专利标题(中): 声誉分析系统和信誉分析方法
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申请号: US13511099申请日: 2010-11-15
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公开(公告)号: US09245023B2公开(公告)日: 2016-01-26
- 发明人: Yuzuru Okajima , Shinichi Ando , Satoshi Nakazawa
- 申请人: Yuzuru Okajima , Shinichi Ando , Satoshi Nakazawa
- 申请人地址: JP Tokyo
- 专利权人: NEC CORPORATION
- 当前专利权人: NEC CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Sughrue Mion, PLLC
- 优先权: JP2009-269484 20091127
- 国际申请: PCT/JP2010/070645 WO 20101115
- 国际公布: WO2011/065295 WO 20110603
- 主分类号: G06F17/30
- IPC分类号: G06F17/30 ; G06Q30/02 ; G06Q10/10
摘要:
Described are a reputation analysis device, reputation analysis method, and reputation analysis-use program capable of suitably analyzing temporal changes in reputation for an object indicated by a keyword. The disclosed reputation analysis device is provided with a voluntary activity description extraction means for extracting descriptions representing voluntary activity related to an object indicated by a keyword that has been input from within a plurality of documents; and a reputation chronological data estimation means for counting the number of occurrences of voluntary activity at each time point wherein the voluntary activity expressed by a description representing the voluntary activity related to the object has been performed, and estimating reputation chronological data for chronologically representing evaluations for the object by the agents of the voluntary activity.
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