Invention Grant
- Patent Title: Probabilistic method and system for testing a material
- Patent Title (中): 用于材料测试的概率法和系统
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Application No.: US13840785Application Date: 2013-03-15
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Publication No.: US09245067B2Publication Date: 2016-01-26
- Inventor: Arun Karthi Subramaniyan , Shesh Krishna Srivatsa , Don Beeson , Liping Wang
- Applicant: General Electric Company
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Paul J. DiConza
- Main IPC: G06G7/48
- IPC: G06G7/48 ; G06F17/50

Abstract:
A method implemented using a processor based device for simulation based testing of materials, includes selecting a first set of points from a data generated from a design space and generating a stochastic metamodel based on the first set of points. The method also includes determining an uncertainty value based on the stochastic metamodel. The method also includes identifying a second set of points different from the first set of points, from the data generated from the design space, based on the uncertainty value. The method further includes combining the second set of points with the first set of points to generate a third set of points, assigning the third set of points to the first set of points. The method also includes iteratively generating, determining, identifying, combining, and assigning steps till the uncertainty value is less than or equal to a predetermined threshold value.
Public/Granted literature
- US20140278310A1 PROBABILISTIC METHOD AND SYSTEM FOR TESTING A MATERIAL Public/Granted day:2014-09-18
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