Invention Grant
- Patent Title: Method and apparatus for detecting tampered application
- Patent Title (中): 检测篡改申请的方法和装置
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Application No.: US13767294Application Date: 2013-02-14
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Publication No.: US09245109B2Publication Date: 2016-01-26
- Inventor: Bumhan Kim , Sunghoon Yoo
- Applicant: Samsung Electronics Co. Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2012-0019115 20120224
- Main IPC: G06F21/51
- IPC: G06F21/51 ; G06F21/64

Abstract:
A method and an apparatus for detecting a tampered application are provided. The method of detecting a tampered application includes acquiring a package of an application, extracting and installing a first execution code from the acquired package of the application, extracting a second execution code from the package of the application when an execution command of the application is received after the first execution code is installed, and performing a preset operation when the second execution code differs from the first execution code.
Public/Granted literature
- US20130227688A1 METHOD AND APPARATUS FOR DETECTING TAMPERED APPLICATION Public/Granted day:2013-08-29
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