Invention Grant
- Patent Title: Low-K oxide deposition by hydrolysis and condensation
- Patent Title (中): 低K氧化物通过水解和缩合沉积
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Application No.: US14464196Application Date: 2014-08-20
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Publication No.: US09245739B2Publication Date: 2016-01-26
- Inventor: Nicholas Muga Ndiege , Krishna Nittala , Derek B. Wong , George Andrew Antonelli , Nerissa Sue Draeger , Patrick A. Van Cleemput
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: Lam Research Corporation
- Current Assignee: Lam Research Corporation
- Current Assignee Address: US CA Fremont
- Agency: Weaver Austin Villeneuve & Sampson LLP
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
Methods for depositing flowable dielectric films using halogen-free precursors and catalysts on a substrate are provided herein. Halogen-free precursors and catalysts include self-catalyzing aminosilane compounds and halogen-free organic acids. Flowable films may be used to fill pores in existing dielectric films on substrates having exposed metallization layers. The methods involve hydrolysis and condensation reactions.
Public/Granted literature
- US20150004806A1 LOW-K OXIDE DEPOSITION BY HYDROLYSIS AND CONDENSATION Public/Granted day:2015-01-01
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