Invention Grant
- Patent Title: Semiconductor packages having through electrodes and methods for fabricating the same
- Patent Title (中): 具有通孔电极的半导体封装及其制造方法
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Application No.: US14264120Application Date: 2014-04-29
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Publication No.: US09245771B2Publication Date: 2016-01-26
- Inventor: Hyunsoo Chung , Keum-Hee Ma , In-Young Lee , Moon Gi Cho , Chajea Jo , Taeje Cho
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0071775 20130621
- Main IPC: H01L21/56
- IPC: H01L21/56 ; H01L23/31 ; H01L23/00 ; H01L25/03 ; H01L25/065 ; H01L25/00 ; H01L21/683

Abstract:
Semiconductor packages having through electrodes and methods for fabricating the same are provided. The method may comprise providing a first substrate including a first circuit layer, forming a front mold layer on a front surface of the first substrate, grinding a back surface of the first substrate, forming a first through electrode that penetrates the first substrate to be electrically connected to the first circuit layer, providing a second substrate on the back surface of the first substrate, the second substrate including a second circuit layer that is electrically connected to the first through electrode, forming a back mold layer on the back surface of the first substrate, the back mold layer encapsulating the second substrate, and removing the front mold layer.
Public/Granted literature
- US20140377909A1 SEMICONDUCTOR PACKAGES HAVING THROUGH ELECTRODES AND METHODS FOR FABRICATING THE SAME Public/Granted day:2014-12-25
Information query
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