Invention Grant
- Patent Title: Semiconductor device packaging methods and structures thereof
- Patent Title (中): 半导体器件封装方法及其结构
-
Application No.: US13369126Application Date: 2012-02-08
-
Publication No.: US09245773B2Publication Date: 2016-01-26
- Inventor: Jing-Cheng Lin , Szu Wei Lu , I-Hsuan Peng
- Applicant: Jing-Cheng Lin , Szu Wei Lu , I-Hsuan Peng
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/66 ; H01L21/56 ; H01L23/00 ; H01L23/498 ; H01L23/538 ; H01L25/065 ; H01L25/00 ; H01L23/31

Abstract:
Semiconductor device packaging methods and structures thereof are disclosed. In one embodiment, a method of packaging semiconductor devices includes coupling a plurality of second dies to a top surface of a first die, and determining a distance between each of the plurality of second dies and the first die. The method also includes determining an amount of underfill material to dispose between the first die and each of the plurality of second dies based on the determined distance, and disposing the determined amount of the underfill material under each of the plurality of second dies.
Public/Granted literature
- US20130200529A1 Semiconductor Device Packaging Methods and Structures Thereof Public/Granted day:2013-08-08
Information query
IPC分类: